Green’s function-based defect identification in InAs-InAs1-xSbx strained layer superlattices
نویسندگان
چکیده
منابع مشابه
Quantitative Study of Compositional Uniformity and Interfacial Strain in InAs/InAs1-xSbx Type-II Superlattices
For infrared photo-detection in mid-wavelength and long-wavelength range, mercury cadmium telluride (MCT) semiconductor alloys remain the most widely used material system despite its major disadvantages of intrinsic Auger recombination and small effective mass. Type-II superlattices (T2SL) have been proposed as possible alternatives to MCT because they may overcome these problems by flexible an...
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Determining vacancy in complex crystals or nanostructures represents an outstanding crystallographic problem that has a large impact on technology, especially for semiconductors, where vacancies introduce defect levels and modify the electronic structure. However, vacancy is hard to locate and its structure is difficult to probe experimentally. Reported here are atomic vacancies in the InAs/GaS...
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Significantly improved carrier lifetimes in very long wavelength infrared (VLWIR) InAs/GaInSb superlattice (SL) absorbers are demonstrated by using time-resolved microwave reflectance (TMR) measurements. A nominal 47.0 Å InAs/21.5 Å Ga0.75In0.25Sb SL structure that produces an approximately 25 μm response at 10 K has a minority carrier lifetime of 140 ± 20 ns at 18 K, which is an order-of-magni...
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ژورنال
عنوان ژورنال: AIP Advances
سال: 2017
ISSN: 2158-3226
DOI: 10.1063/1.4989564